下载

下载手册、产品技术资料、软件等：

下载类型
型号或关键字

gongjigongyi.com

与米乐m6网页版登录入口代表实时聊天。 工作时间：上午 9:00 - 下午 5:00（太平洋标准时间）。

电话

致电我们

工作时间：上午9:00-下午5:00（太平洋标准时间）

半导体测试系统

应用指南

有机FET的 DC I-V和AC 阻抗测试

9/15/2021

本技术指南概括介绍怎样使用4200A-SCS参数分析仪优化OFET的DC I-V和AC阻抗测量。讨论定时参数、降噪、屏蔽、正确布线及实现最佳效果的其他重要测量考虑因素。

解决方案简介

为新一代电力电子设计改进材料和测试

5/15/2019

Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increa …

视频
Make I-V and C-V Measurements up to 2X Faster with the 4200A-SCS Parameter Analyzer

Make I-V and C-V Measurements up to 2X Faster with the 4200A-SCS Parameter Analyzer

8/31/2020

Measuring new materials or devices? Watch how you can get insights faster-than-ever with hassle-free connections, faster test setup, and built-in test libraries and learning tools. See how to gain com …

在线研讨会
Tips and Techniques to Simplify MOSFET-MOSCAP Device Characterization

Tips and Techniques to Simplify MOSFET-MOSCAP Device Characterization

8/31/2020

This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to ge …