Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration capabilities of Keithley’s Series 2600B, Series 2400, and Series 2400 Touchscreen SourceMeter® Source Measure Unit (SMU) instruments and 2651A and 2657A System SourceMeter SMU instruments. The result—you can produce lifetime predictions from two to five times faster than you can with conventional WLR test solutions, allowing you to accelerate your technology development, process integration, and process monitoring for faster time to market.